The CuS thin films were deposited on glass substrates using the chemical bath deposition technique at 65 °C temperature from aqueous
solutions of copper sulphate and thiourea in which tartaric acid solution were employed as the complexing agent. HRXRD studies reveal
covellite CuS, having hexagonal primitive crystal structure. AFM studies shows morphology of CuS thin film as spherical particles, and
spiky cones showing probability of nanorod formation of CuS. The grains are distributed homogeneously with a pattern consistent with
polycrystalline film. Lower value of RMS value for CuS 8 sample of thin film (15.5907 nm) shows that less light is scattered by an optical
surface, and hence better the surface quality of thin film. Absorbance of thin film observed between 300-350 nm. The highest transmittance
of the as-grown film in the entire wavelength of interest was recorded as 50 %.
Key words: Atomic force microscopy, Chemical bath deposition, CuS, Optical properties, High resolution XRD
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