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Research Article

ECB. 2017; 6(10): 426-429

Investigation on the structural and optical properties of Zn1-xCuxO (x=0, 0.05, 0.1) sintered films for optoelectronic device applications

Santosh Chackrabarti, Shabir Ahmad Bhat,Bashir Mohi Ud Din Bhat, Imran Khan, Rayees Ahmad Zargar.


The pure and copper doped zinc oxide Zn1-xCuxO (x=0,0.05,0.1) thick films were deposited on glass substrates by screen printing method from their nano powders, followed by sintering at 500 0C to obtain desired stoichiometry and better adherence of films. The structural and optical properties of the samples were studied by X-ray diffraction (XRD), scanning electron microscopy (SEM) with UV–visible spectroscopy and Raman spectroscopy. XRD patterns confirmed hexagonal wurtzite structure with minor detection of Cu and SEM micrographs revealed granular grains and porosity in films. The optical properties and the energy band gap of pure and Cu2+ions doped ZnO films were studied by UV–visible absorbance spectroscopy. As the doping concentration is increased, both the absorption edge and the reflectance edge is found to shift towards higher wavelengths (red shift) and the direct band gap decreased from 3.4 to 3.3 eV. The incorporation of copper in ZnO lattice is confirmed by Raman spectrum. The E2 (high) phonon and multiphoton modes are observed at 441 and 1132 cm-1respectively in Raman spectra.

Key words: Thick films; Screen printing; XRD; SEM; Raman analysis.

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