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Research Article

. 2017; 5(1): 12-16


E.Sowmiya Dr.V.Chandrasekaran and T.Sathya Master of Engineering in Applied electronics,Velalar College of Engineering and Technology,Thindal,Erode,India Associate Professor Department of ECE Velalar College of Engineering and Technology Thindal,Erode Indian Assistant Professor Department of ECE Velalar College of Engineering and Technology Thindal,Erode,India..


In these days, the application of Wireless Sensor Networks (WSNs) have been increased .Advance in microelectronic fabrication technology also reduces the manufacturing cost. Detecting node failures in Wireless Sensor Networks is very challenging because the network topology can be highly dynamic, the network may not always connected and the resources are limited . It becomes trend to deploy the large number of portable wireless sensors in Wireless Sensor Networks, in order to increase the Quality of Service (QoS). The QoS is mainly affected by the failure of sensor node .The sensor node failure increases with the increase in number of sensors in Wireless Sensor Networks. In order to maintain better QoS in such failure condition, Identifying and Detaching such faults are essential. In the proposed method the faulty sensor node is detected by measuring the Round Trip Delay (RTD) time of Discrete Round Trip paths and comparing them with threshold value. In proposed method, Scalability is verified by simulating the WSNs with large numbers of sensor nodes in NS2. The RTD time results derived in hardware and software implementation are almost equal, justifying the real time applicability of the investigated method.

Key words: —Faulty sensor node, round trip delay, round trip paths, Wireless Sensor Networks.

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