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Original Research

Ann Med Res. 2015; 22(2): 94-98


Evaluation of Central Corneal Thickness Measurements by Optical Low Coherence Reflectometry and Contact Ultrasonic Pachymeter

Tolga Kocaturk, Erol Erkan, Harun Cakmak, Imran Kurt Omurlu, Volkan Dayanir.




Abstract

Objective: The aim is to compare the central corneal thickness measurements by optical low-coherence reflectometry and contact
ultrasonic pachymeter in patients with pseudoexfoliation syndrome, pseudoexfoliation glaucoma, primary open-angle glaucoma as well as
healthy subjects.
Materials and Methods: We have made a survey of the data of the patients with glaucoma who had been followed for ten years at the
Department of Ophthalmology. 148 eyes of 76 patients who had central corneal thickness measurements with both optical low-coherence
reflectometry and ultrasonic pachymeter during their follow-ups were included in the study. Central corneal thickness values were
statistically analyzed.
Results: 46 of 76 patients (60.5%) were females, 30 patients (39.5%) were males, and the mean age was 69.1±6.06. Patients were divided
into 4 groups; 36 eyes with pseudoexfoliative glaucoma (Group 1), 33 eyes with pseudoexfoliative syndrome (Group 2), 34 eyes with
primary open angle glaucoma (Group 3), and 45 healthy eyes (Group 4). The mean central corneal thickness value was found to be
540.48±34.32 µm by ultrasonic pachymeter; it was 539.62±34.16 μm by optical low-coherence reflectometry. We did not observe any statistically significant difference between the mean central corneal thickness values (p=0.130).
Conclusion: The results of central corneal thickness measurements obtained by ultrasonic pachymeter and optical low-coherence
reflectometry were found to be in strong correlation. We think that optical low-coherence reflectometry, which has an advantage in terms
of patient comfort with its non-contact operating principle, may be a preferable alternative for central corneal thickness measurements.

Key words: Glaucoma; Pseudoexfoliation Syndrome; Central Corneal Thickness; Optical Low-Coherence Reflectometry.






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